Gap and Van Hove Measurements via Low-loss Electron Energy Loss Spectroscopy on Atomically thin MoxW(1-x)S2 Nanoflakes

Pelaez Fernández, Mario (Universidad de Zaragoza, Instituto de Nanociencia de Aragón, Spain) ; Suenaga, Kazu (Nanotube Research Center, National Institute of Advanced Industrial Science and Technology, Japan) ; Arenal, Raul (Institute of Nanosciences of Aragon, Spain)

Abstract:
Band gap tailoring of 2D materials has been of interest for the past years. Using low-loss electron energy loss spectroscopy (EELS), in a scanning transmission electron microscope (STEM), it has been confirmed, following previous experimental (photoluminescence) and theoretical (DFT) studies, that the band gap of atomically thin nanoflakes of MoxW(1-x)S2 does shift with the alloying degree of the sample

Idioma: Inglés

DOI: 10.1109/NMDC.2016.7777170

Año: 2016

En: 11th IEEE Nanotechnology Materials and Devices Conference (2016, Toulouse-France)

Financiación: info:eu-repo/grantAgreement/ES/MINECO/FIS2013-46159-C3-3-P
Financiación: info:eu-repo/grantAgreement/EU/ERC-H2020/642742
Financiación: info:eu-repo/grantAgreement/EU/ERC-H2020/696656

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Este artículo se encuentra en las siguientes colecciones:
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 Record created 2018-05-02, last modified 2018-05-03


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