GDOC-2017-66104

Caracterización II: Microscopias avanzadas - [66104]


Curso: 2017-2018

Universidad de Zaragoza, Zaragoza

Titulación: Máster Universitario en Materiales Nanoestructurados para Aplicaciones Nanotecnológicas

Idioma: Español

Profesor(es): JOSÉ IGNACIO ARNAUDAS, PONTAQUE ; PILAR CEA, MINGUEZA ; CESAR MAGÉN, DOMÍNGUEZ ; SANTIAGO MARTÍN, SOLANS ; JAVIER PABLO, NAVARRO ; TEOBALDO ENRIQUE TORRES, MOLINA

Resumen: Breve presentación de la asignatura LA ASIGNATURA SE IMPARTE EN INGLES Y LA GUIA DOCENTE SE PROPORCIONA SOLO EN ESE IDIOMA. THIS MODULE IS TAUGHT IN ENGLISH. INFORMATION IS ONLY AVAILABLE IN THIS LANGUAGE. PLEASE, GO TO THE ENGLISH VERSION.

Abstract: This subject will show the student the advanced microscopes (electronic, dual-beam and scanning probe) that allow the morphology and topography of nanostructured materials to be studied with nanometric resolution in addition to being powerful analytical tools, determining electric and magnetic properties at the molecular scale and allowing the handling of the substance at atomic and molecular scale. A brief description of the contents of this subject includes: Introduction to electron and scanning probe microscopy. Scanning electron microscopy. Transmission electron microscopy (image and diffraction). Analysis techniques linked to electron microscopy: energy dispersive X-ray spectroscopy and electron energy loss spectroscopy. Atomic and magnetic force microscopy. Scanning tunnelling microscopy. Surface spectroscopy.  Other advanced optical microscopes: confocal and near-field.   The theory classes are complemented by practical sessions including: 1.- SEM 2.- TEM 3.- STM 4.- AFM

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Este registro pertenece a las colecciones:
Academic resources > Academic guides > guias-docentes-ciencias > masteres-ciencias > master-materiales-nanoestructurados-aplicaciones-nanotecnologicas
Academic resources > Academic guides > Guías docentes: Curso 2017-2018



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